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Application

NanoSystem provides the best solution for the high precision 3D measurement.
We always do our best in order to offer the fast, precise, and user-friendly instrument.
We promise to accelerate your technology.

Semiconductor/FPD/PCB

Dimple

-Dimple

Trace

-Trace

Pad

-Pad

Metal mask

-Metal mask

MCP unit

-MCP unit

Glass defect

-Glass defect

OLED pattern

-OLED pattern

Bump on BGA

-Bump on BGA

Laser marking on wafer

-Laser marking on wafer

Engineering/Optical/Precision Parts

Copper roughness

-Copper roughness

Ball end mill

-Ball end mill

COG decap

-COG decap

MEMS

-MEMS

Nuclear pipe

-Nuclear pipe

MLCC

-MLCC

Micro lenses

-Micro lenses

Film scratch

-Film scratch

Organic pattern

-Organic pattern

SALES
82-(0)42-717-2400

Korea 90, Techno 2-ro, Yuseong-gu, Daejeon, Korea

Tel

82-(0)42-717-2400

Fax

82-(0)42-717-2401

China

A3-11-12, TuoXinShiDai, YuZuiZhen, ChongQing, 401133 CHINA
Tel : +86-157-3012-8229