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Patents Registration

No. Status Date Patent No. Title
1 Registration 2001.02.27 290086 Using White Light Interferometry, 3D Thickness shape measurement of transparent thin film and a refractive index measurement method and record media
2 Registration 2006.10.26 10-0641885 Light phase interferrometry method and system for horizontal scanning type
3 Registration 2007.08.17 10-0751924 Three dimensional shape measuring apparatus
4 Registration 2009.09.02 10-0916593 A 3D shape measuring system in real time
5 Registration 2010.02.12 10-0943405 A 3D shape measuring system using lateral scan
6 Registration 2010.02.12 10-0943406 Self-compensating apparatus of interference-fringe-generating position to compensate optical path difference result fromobjectives lens working distance variation for environment temperature variation in regard of interference lens
7 Registration 2010.02.12 10-0943407 3D shape measuring system using projection
8 Registration 2012.09.07 10-1182807 Optical path adjustment device of interferometry and using optical path adjustment device, optical path adjustment method
9 Registration 2013.04.08 10-1254297 Shape and thickness measurement system and shape and thickness measurement method
10 Registration 2014.11.10 10-1462046 Glass edge manufacture device


Korea 90, Techno 2-ro, Yuseong-gu, Daejeon, Korea






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