|President||Hyeong-Seok Lee, Ph.D|
|Establishment||April 24, 2003|
|Company||Non-contact surface measurement and inspection equipment field / CSP, FCBGA Substarate inspection field / LCD measurement and inspection equipment field|
|Product||Non-contact 3D surface measuring equpment|
|Head office||90, Techno 2-ro, Yuseong-gu, Daejeon 305-509, KOREA|
Nanosystem is a company established in April 2003 that provides solution and
measurement system for non-contact surface measurement and inspection.
Global Leading Company
Nanosystem sets up the core technology of non-contact 3D measurement / inspection and enters the overseas based on excellent expertise, market competitiveness and company record. We are the global leading company that aims for the world best.
Nanosystem runs business with demand of customers as the goal with differentiated strategy in the area of the promising business of precise measurement and inspection equipment in the 21th century.